Production of X-ray probes by a synchrotron light source. To optimize the properties of nanomaterials and the atomic level, an elementary probe with a resolution <1 nm is required. The nanoscale probe is useful for providing reproducible defect monitoring. The production of X-rays by relativistic electrons in accelerators dates back about 60 years. Accelerator facilities used as sources of synchrotron radiation have advanced significantly over the years, becoming increasingly useful to become a premier research tool for the study of materials. The evolution of these facilities is generally described as a sequence of generations of synchrotron radiation sources. Fourth generation sources are currently being designed and demonstrated. Two approaches have been proposed, both using a linear accelerator, or linac, instead of or in addition to a circulating storage ring for the production of very low-emissivity and ultrashort electron bunches as a radiation source. With a very long inverter placed at the end of a suitable linac, sub-picosecond pulses of coherent radiation can be produced with a peak brightness several orders of magnitude greater than that of third generation sources. These free electron lasers operate either by self-amplified spontaneous emission or by seeding with an external pulsed laser synchronized to the electron bunches. Or, a recirculating linac can be incorporated into a storage ring installation to lower emittance at a strategic location while allowing other insertion devices to operate in parallel. The Hard X-ray Nanoprobe Beamline (or Nanoprobe Beamline) is an for Nanoscale Materials. This side...... middle of paper ......): 1056-1060.2. JG Parsons a, MV Aldrich a & JL Gardea-Torresdey, REVIEWS IN APPLIED SPECTROSCOPY Vol. 37, no. 2, pp. 187-222, 2002.3.Tatjana Paunesku, Stefan Vogt, Jo¨rg Maser, Barry Lai and Gayle Woloschak, Journal of Cellular Biochemistry 99:1489-1502 (2006)4.Jacobsen, C., et al. “Diffraction-Limited Imaging in a Transmission and Scanning X-ray Microscope.” Optics Communications 86.3 (1991): 351-364.5. Flegler, Stanley L., John William Heckman, and Karen L. Klomparens. Scanning and transmission electron microscopy: an introduction. Oxford University Press, 1995.6. Rochow, Theodore George and Paul A. Tucker. Introduction to microscopy using light, electrons, X-rays or acoustics. Springer, 1994.7.http://www.international.mq.edu.au/globe/2008-03/research8.http://www.synchrotron.org.au/index.php/synchrotron-science/how-is- synchrotron-created light