Introduction: Scanning probe microscopy in nanomechanical testing began with the invention of the scanning tunneling microscope in 1981. Until then, on the basis of the type of existing principles number of models developed and used. Scanning probe microscopy has gained popularity due to its ease and versatility in treating a number of problems. It is generally used to identify material properties at nanoscales, or even picoscales. Scanning probe microscopy techniques such as atomic force/friction microscopy (AFM/FFM) are increasingly finding applications in tribological studies of engineering surfaces as well as finding surface texture, etc. Details at the atomic and molecular level can be assessed using scanning probe microscopy with great ease and the instruments are very versatile. AFMs with appropriate tips are used to study problems such as scratches, wear, etc. The scratch and wear properties of various materials were measured. Material removal mechanisms are also studied. Localized surface elasticity maps of composite materials with penetration depths less than 10 nm can be found using SPM with nanomechanical testing procedures. The nano indentation hardness and young elastic modulus can be measured with an indentation depth as small as 1 nm. Nanoscale scratches and indentations are powerful ways to control the adhesion and warp resistance of ultrathin coatings. These studies provide insight into the failure mechanisms of thin materials and coatings. SPM in nanomechanical testing provides insight into surface characterization and provides insight into the study of failure mechanisms. (Bhushan, 2001). The way to use the interactions between the probe and the surface to obtain an image is genetic...... middle of paper ......scopy to the characterization and fabrication of hybrid nanomaterials. al, ME (2004). Characterization of nanomaterials by scanning microscopy. al, MM (2011). Scanning probe microscopy: Measurement on hard surfaces. NanoCon. Czech Republic: NaonCon. al, Nm (2012). Advances in the fabrication of molded tips for scanning probe microscopy. ASME Journal of Microelectromechanical Systems, 431-442. al, V.m. (2012). applications of long-range scanning probe microscopy in local mechanical analysis. NanoCon. Czech Republic: NanoCon. Bhushan, B. (2001). Nanometric to microscopic wear and mechanical characterization by scanning probe microscopy. Wear, 1105-1123. Characterization of nanomaterials by scanning probe microscopy. , Mc Grawhill publications, NewDelhi, 2009. Scanning probe microscopy (al ke, 2007) Bhushan, B. (2011). Nano tribology and nano mechanics. Springer.